The Model 125 Low Vibration Cryogenic Probe Station offers a cryogenically robust platform for low-temperature device probing. Unlike systems whose actuators are placed at 300K, our probe station uses translation stages that are thermally anchored at 4K. This reduces sample temperature elevation due to manipulator arm heat leak.
The Model 125 Probe Station can be configured to host either individual chips or whole wafers. Other options include translations up to the full diameter of the wafer, window shutters, coaxial cables and sample magnets.
The Model 125 Probe Station employs additional vibration damping by decoupling the direct connection from the cryopump to the cryostat.
Interested in our other cryogenic probe stations?
Interested in our other probe stations?